| SN74LVTH182512DGGR | ||
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| 产品描述：
IC SCAN-TEST-DEV/XCVR 64-TSSOP
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| 标准包装：2000 | ||
| 数据手册： -- | ||
| ECAD模型:
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- 规格参数
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| Supply Voltage | 2.7 V ~ 3.6 V |
|---|---|
| Logic Type | ABT Scan Test Device With Universal Bus Transceivers |
| Part Status | Active |
| Manufacturer | Texas Instruments |
| Family | Logic - Specialty Logic |
| Number of Bits | 18 |
| Packaging | Digi-Reel® |
| Supplier Device Package | 64-TSSOP |
| Package / Case | 64-TFSOP (0.240", 6.10mm Width) |
| Category | Integrated Circuits (ICs) |
| Series | 74LVTH |
| Mounting Type | Surface Mount |
| Operating Temperature | -40°C ~ 85°C |
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