English
简体中文
日本語
Home
Manufacturers
Eleceye
About Us
Search
AFBR-S20N1N256
博通, 评估模块, 光学, 用于NIR 测量 950 → 1700 nm, Qneo芯片
Manufacturer
Broadcom
MPN
AFBR-S20N1N256
SPQ
1
ECCN
--
Schedule B
--
RoHS
--
Datasheet
--
Quote
Demand quantity
Target price
Contact number
name
company
email
Product parameter
Copyright © 1997-2013 NetEase. All Rights Reserved.